Current Research

Component-Level Characterization for System-Level EMC Simulations

Principal investigators:

Todd H. Hubing and Haixin Ke


Brief abstract:

The electromagnetic compatibility of a complex system is highly dependent on the electromagnetic behavior of its components. Existing component-level EMC tests do not provide enough information about the component to predict how it will interact with other components in the system. Because of this, it is not possible to predict system-level EMC performance based on component-level EMC test data.

The goal of this project is to identify specific component-level test procedures that will yield the information necessary to perform system-level EMC simulations. The basic approach is to divide all coupling into four categories: conducted, near-field electric, near-field magnetic and radiated. Four independent tests are done on each component to identify its ability to couple to a system through each of these mechanisms.

Impact:

Automobile manufacturers and automotive electronics suppliers benefit by finding potential electromagnetic interference problems early in the design process. Automobile owners benefit because their vehicles are less expensive and more reliable.