Active Interaction Force Identification for Atomic ForceMicroscope Applications

Abstract

In an effort to improve sub-molecular imaging precision, ageneral distributed-based modeling approach for the atomic forcemicroscope system is proposed which allows for the design of astabilizing controller/estimation scheme that stabilizes themicro-cantilever based system while asymptotically identifying theatomic interaction force. That is, the estimated interaction forceasymptotically approaches the actual interaction force; hence, theestimated interaction force can be utilized to generate highprecision atomic-resolution images. Differing from currentpractices of simple lumped model sets of ordinary differentialequations, the proposed approach attacks the more difficultdistributed parameter model.

Publication

For more information concerning this research, please refer tothe following publication:

Y. Fang, M. Feemster, D. M. Dawson and N. Jalili,"Active Interaction Force Identification forAtomic Force Microscope Applications", Proc. of the IEEEConference on Decision and Control, December, 2002, to appear.

References