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SEM-Hitachi
S3500N
The 3500 is designed for conventional and variable pressure microscopy.
It is equipped with a lithography system.
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SEM 3400 S-3400N
The 3400 is
designed for conventional and variable pressure microscopy. It
is equipped with an Oxford INCA EDS, WDS, EBSD, and built-in four
quadrant solid-state backscatter detector. Also has SEM imaging
capability in variable pressure.
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FESEM-
Hitachi S4800
The 4800 offers field emission for high resolution microscopy. It is equipped
with an Oxford INCA Energy 200 EDS and a GW Electronics Centaurus backscatter
detector. |
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STEM-Hitachi
HD2000
The HD2000 offers 200kv high resolution field emission field emission microscopy
and is specifically designed for material science applications. It is equipped
with an Oxford INCA Energy 200 EDS. |
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TEM-Hitachi
H7600T
The H7600T offers 120kv with LaB6 capability for a wide variety of material science/biological
applications where selective kv is required. It is equipped with an Oxford INCA
Energy 200 EDS, double tilt stage, multi-specimen holder, tomography, STEM, and
cryo attachment.
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TEM
9500
The
9500 offers 300kv high magnification TEM and is designed for atomic
resolution.
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Focused
Ion Beam-Hitachi FB2000A
The unit is used for thin sample preparation for the TEM and STEM
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XPS-KRATOS
AXIS 165
The XPS
provides unique problem solving capabilities for a wide range
of surface analysis applications.
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