The Handheld Energy dispersive X-Ray Fluorescence Tracer III-SD manufactured by Brucker AXS has a typical resolution of 145eV at 100Kcps. XRF is an analytical technique using the interactions of X-rays with a material to determine its elemental composition. It is suitable for solids, liquids and powders and is widely used for Non-Destructive elemental analysis (metal, glass, ceramics, building materials, etc).
Light element analysis – Mg, Al, Si, P, S and Cl
Adjustable Tube Voltage and Current Settings
High sensitivity to 1mg/cm
User selectable filters/secondary targets (used to adjust the incident X-ray beam in both energy distribution and intensity)