Scanning Electron Microscope - EDS/WDS

Hitachi S-3700N ,courtesy WLCCThe Hitachi S-3700N is designed for conventional and variable pressure microscopy with ultra large chamber. This unit allows observation of most samples in their natural state, or wet condition, without the need of metal coating. Equipped with an Oxford INCAx-act EDS, and an INCAWave 500i WDS which provide accurate qualitative and quantitative elemental microanalysis.

Features:

  • ultra large chamber (max 300mm dia.)
  • -25 oC to +50 oC Deben cooling stage
  • Secondary electron (SE) detector
  • Backscattered electron (BSE) detector
  • Environmental secondary electron (ESED) detector
  • Chamber Scope

Advantages of VP-SEM:

  • Possible analysis of vacuum sensitive materials, such as moist, liquid, or out-gassing samples
  • Possible analysis and imaging of non-coated, non-conductive materials with minimal local surface charging
  • Atmosphere within the Specimen chamber can be modified to facilitate examination of dynamic processes (wetting and drying) at high magnifications

Hitachi S-3700N ,courtesy WLCC


Hitachi S-3700N ,courtesy WLCC


Courtesy WLCC – Elemental Analysis of the cross-section of a gilded paint chip


Courtesy WLCC – Localized elemental analysis of a paint chip containg Lead


Courtesy WLCC – Localized elemental analysis of a paint chip containg Lead


Mapping capability ,courtesy WLCC

Courtesy WLCC – Detection of Lead in a Paint cross section


Imaging Capability:

Hitachi S-3700N Imaging Capability, Courtesy WLCC

Hitachi S-3700N Imaging Capability, Courtesy WLCC

Hitachi S-3700N Imaging Capability, Courtesy WLCC

Hitachi S-3700N Imaging Capability, Courtesy WLCC

Hitachi S-3700N Imaging Capability, Courtesy WLCC

Hitachi S-3700N Imaging Capability, Courtesy WLCC

Hitachi S-3700N Imaging Capability, Courtesy WLCC